Recent developments in traceable dimensional measurements III (31 July-1 August 2005, San Diego, California, USA)Decker, Jennifer E; Peng, Gwo-Sheng.SPIE proceedings series. 2005, isbn 0-8194-5884-8, 1Vol, pagination multiple, isbn 0-8194-5884-8Conference Proceedings

First domestic comparison of ball plate calibration in JapanOSAWA, Sonko; TAKATSUJI, Toshiyuki; KUROSAWA, Tomizo et al.SPIE proceedings series. 2005, pp 58790U.1-58790U.11, isbn 0-8194-5884-8, 1VolConference Paper

Methods for evaluating the reference value in laboratory intercomparisons of dimensional measurementsSTONE, Jack A.SPIE proceedings series. 2005, pp 58790V.1-58790V.8, isbn 0-8194-5884-8, 1VolConference Paper

The identification and repair of anomalous measurements in the measurement of big diameter based on rolling-wheel methodCHEN, Haiou; YU, Xiaofen.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 7997, issn 0277-786X, isbn 978-0-8194-8570-0, 79971G.1-79971G.6, 2Conference Paper

A primary roundness measuring machineTHALMANN, Ruedi; SPILLER, Jürg.SPIE proceedings series. 2005, pp 58790E.1-58790E.10, isbn 0-8194-5884-8, 1VolConference Paper

The detection of cyclic nonlinearities in a ZMI2000 heterodyne interferometerTHIJSSE, Jorrit; JAMTING, Asa K; BROWN, Nick et al.SPIE proceedings series. 2005, pp 58790M.1-58790M.11, isbn 0-8194-5884-8, 1VolConference Paper

Design and calibration of an elastically guided CMM axis with nanometer repeatabilitySEGGELEN, J. K. V; ROSIELLE, P. C. J. N; SCHELLEKENS, P. H. J et al.SPIE proceedings series. 2005, pp 58790T.1-58790T.8, isbn 0-8194-5884-8, 1VolConference Paper

Performance assessment of involute gear measurement by CMM using a double-ball artifactTAKATSUJI, Toshiyuki; KONDO, Koshi; KUBO, Aizo et al.SPIE proceedings series. 2005, pp 58790Q.1-58790Q.7, isbn 0-8194-5884-8, 1VolConference Paper

A new approach to determining the key comparison reference valueBROWN, N.SPIE proceedings series. 2005, pp 58790W.1-58790W.7, isbn 0-8194-5884-8, 1VolConference Paper

Dimensional optical metrology and inspection for practical applications (222-23 August 2011, San Diego, California, United States)Harding, Kevin G; Huang, Peisen S; Yoshizawa, Toru et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8133, issn 0277-786X, isbn 978-0-8194-8743-8, 1 vol, isbn 978-0-8194-8743-8Conference Proceedings

Analysis of straight edges by means of gammametryFAVRET, E; CANZIAN, A; GALDOS, J et al.Kerntechnik (1987). 2000, Vol 65, Num 1, pp 49-53, issn 0932-3902Article

A novel laser tracking testbed for robot trajectory errorsANHULI; ZHIZHONG LI; WEI WANG et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8133, issn 0277-786X, isbn 978-0-8194-8743-8, 81330S.1-81330S.7Conference Paper

Accurate extraction of thermal expansion coefficients and their uncertainties from high precision interferometric length measurementsSCHÖDEL, R.SPIE proceedings series. 2005, pp 587901.1-587901.11, isbn 0-8194-5884-8, 1VolConference Paper

A new design and uncertainty budget for a metrology UHV-STM used in direct measurements of atom spacingsGONDA, Satoshi; HUI ZHOU; FU, Joseph et al.SPIE proceedings series. 2002, pp 125-131, isbn 0-8194-4347-6, 7 p.Conference Paper

Challenges faced in applying 3D non-contact metrology to turbine engine blade inspectionROSS, Joseph; HARDING, Kevin; HOGARTH, Eric et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8133, issn 0277-786X, isbn 978-0-8194-8743-8, 81330H.1-81330H.9Conference Paper

High resolution diameter estimation of micro-thin wires by a novel 3-D diffraction modelVYAS, Khushi; KAMESWARA RAO LOLLA.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8133, issn 0277-786X, isbn 978-0-8194-8743-8, 813311.1-813311.8Conference Paper

Precise certification of the temperature measuring system of the original kosters interferometer and ways of its improvementTITOV, Alexander; MALINOVSKY, Igor; ERIN, Madlen et al.SPIE proceedings series. 2005, pp 587904.1-587904.10, isbn 0-8194-5884-8, 1VolConference Paper

Phase Reconstruction Method Using Frequency ShiftingCHENGGONG ZHANG; YINGJIAN GUAN; XIAOLI LIU et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8133, issn 0277-786X, isbn 978-0-8194-8743-8, 813306.1-813306.8Conference Paper

Uniaxial 3-D shape measurement with projector defocusingYING XU; EKSTRAND, Laura; SONG ZHANG et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8133, issn 0277-786X, isbn 978-0-8194-8743-8, 81330M.1-81330M.8Conference Paper

Effects of Water Flow Rate on Transparent Window Size for Form Error In-Process Optical MeasurementGAO, Y; WANG, J. X; ZHANG, Y et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7544, issn 0277-786X, isbn 978-0-8194-7940-2, 75440M.1-75440M.7, 3Conference Paper

On the influence of gaug& block roughness characteristic and surface treatment on length calibration by optical interferometryDECKER, Jennifer E; FRANKE, Peter; BÖNSCH, Gerhard et al.SPIE proceedings series. 2005, pp 587907.1-587907.7, isbn 0-8194-5884-8, 1VolConference Paper

Network compensation of optical metrology for satellite formation flyingMOTRENA, Paulo Jorge; REBORDAO, José Manuel; PEREIRA CABRAL, Alexandre et al.SPIE proceedings series. 2005, pp 58790P.1-58790P.12, isbn 0-8194-5884-8, 1VolConference Paper

A fiber probe for CMM measurements of small featuresSTONE, Jack A; MURALIKRISHNAN, Bala; STOUP, John R et al.SPIE proceedings series. 2005, pp 58790R.1-58790R.11, isbn 0-8194-5884-8, 1VolConference Paper

Calibration of two-dimensional nanometer gratings using optical diffractometer and metrological atomic force microscopeKIM, Jong-Ahn; JAE WAN KIM; BYONG CHON PARK et al.SPIE proceedings series. 2005, pp 58790Z.1-58790Z.8, isbn 0-8194-5884-8, 1VolConference Paper

Systematic bias compensation for a Moiré fringe projection systemPURCELL, D; SAMARA, A; DAVIES, A et al.SPIE proceedings series. 2005, pp 587909.1-587909.8, isbn 0-8194-5884-8, 1VolConference Paper